Condition: Used

The Olympus U-AN360 is a 360° rotatable analyzer slider for use with Olympus BX-series reflected light microscopes, offered here in good used condition. It is suitable for polarized light and Nomarski DIC observation applications.

Typically includes:
• U-AN360 rotatable analyzer slider

The Olympus U-AN360 is a 360-degree rotatable analyzer slider accessory designed for use with the Olympus BX-series upright research microscopes. It is a key component for reflected light polarized observation and Nomarski Differential Interference Contrast (DIC) microscopy. The slider inserts into the analyzer slot of compatible Olympus reflected light illuminators, allowing the user to engage or disengage the analyzer from the light path quickly and easily.

The analyzer rotates a full 360° and features a locking mechanism so the polarization angle can be precisely set and held, including the crossed Nicol (extinction) position required for polarized light work. When paired with an Olympus U-PO3 or U-POTP3 polarizer, the U-AN360 enables complete polarized light visualization. A coupling plate supplied with compatible polarizers allows the analyzer and polarizer to be mechanically linked.

The U-AN360 is listed in the Olympus BX system diagram alongside the U-AN (fixed analyzer) as an alternative offering full angular adjustability — essential for DIC, birefringence, and mineralogical studies.

Key Specifications:
Type: Rotatable analyzer slider
Rotation Range: 360°
Locking Mechanism: Yes — clamping screw for angle fixation
Minimum Rotation Angle: Continuous (graduated dial)
Mounting: Slide plate for reflected light illuminator analyzer slot
Compatibility: Olympus U-URA and U-RLA vertical illuminators; BX-series microscopes (BX40, BX45, BX50, BX51, BX51M, BX60, BX61, BXFM)
Weight: 79 g
Olympus Part Reference: U-P219 (for U-URA/U-RLA); also listed as U-AN360-3 with locking plate for U-PO3
Typical Applications: Reflected light polarized observation, Nomarski DIC microscopy, birefringence analysis, materials science, geology/mineralogy, semiconductor and metallurgical inspection

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